Surface Analysis, Electron Spectroscopy, STM, SPM, MBE, Deposition

Within the Network of Compentence SPECS and BESTEC cooperate in the supply of surface analysis systems to research institutes.

The joint production of a system for complex surface analysis on fluids and of an
Analyser ESCA system with Scanning Probe Microscope are practical examles for this successful business partnership.

With its 20 worldwide patents SPECS stands for constant innovation in technology and quality. One main research field of SPECS is Energy Analyser Technology.
SPECS offers state of the art high resolution and high efficiency energy analysers. The detection systems can be adapted to user requirements. Options include
single and multi channel detection, 2D-detection and electron spin detectors.

X-Ray Sources, UV Sources, Ion Sources, Electron Sources
Also a wide range of excitation sources for dedicated surface analysis experiments are available from SPECS. This includes monochromatic photon sources for high resolution spectroscopy with highest count rates. Scanable and fine-focus
particle sources are available for controlled electron and ion excitation as well as depth profiling.

BESTEC provides complete Beamlines and experimental endstations for photoemission experiments in the soft X-ray and IR regime including mirror chambers and monochromators for Synchrotron Radiation Facilities. Bestec also offers UHV surface analysis systems for XPS / UPS, ESCA and AUGER spectroscopy as well as SIMS Workstations.