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XPS
-
X-Ray Photoemission Spectroscopy |
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AES
- Auger Electron Spectroscopy |
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SEM
- Scanning
Electron Microscopy
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SAM - Scanning Auger Microscopy |
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LEEM
- Low
Energy Electron Microscopy
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HREELS
- High
Resolution Electron Energy Loss Spectroscopy
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LEED - Low Energy Electron Diffraction |
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RHEED - Reflection High Energy Electron Diffraction |
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SNMS - Secondary Neutral Mass Spectroscopy | ||
| ISS - Ion Scattering Spectroscopy | |||
Network
of Competence
c/o SPECS GmbH
Voltastr. 5
13355 Berlin Germany
Phone: +49 30 467824-0
Fax: +49 30 4642083
info@network-of-competence.com
c/o SPECS GmbH
Voltastr. 5
13355 Berlin Germany
Phone: +49 30 467824-0
Fax: +49 30 4642083
info@network-of-competence.com