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The hemispherical energy analyser PHOIBOS can be equipped with various detection systems, i.e. a 2D-CCD-imaging system, a spin-detector or a 48-channel detector. By
new licence, a Low Energy Electron Microscope (LEEM) has recently joined
the SPECS product line. This sophisticated research instrument shows
unsurpassed 5 nm resolution in dynamic LEEM experiments.
Surface
Analysis-Systems SPECS
has a worldwide
sales, support and cooperation partner network.
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Network
of Competence c/o SPECS GmbH Voltastr. 5 13355 Berlin Germany Phone: +49 30 467824-0 Fax: +49 30 4642083 info@network-of-competence.com |